{"bekendtgoerelseNoegle":{"noticeId":{"value":"f58ccd3d-ce78-49d4-b81f-cddd314fba1a"},"noticeVersion":{"value":"01"},"noticePublicationNumber":{"value":"00594456-2024"}},"htmlDA":"\n\n \n
1 Køber
1.1 Køber
Officielt navn: Danmarks Tekniske Universitet - DTU
\n
Køberens retlige status: Offentligretligt organ
\n
Den ordregivende myndigheds aktiviteter: Uddannelse
\n
\n
\n
2 Procedure
2.1 Procedure
Titel: Near Axis TKD detector
\n
Beskrivelse: DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition\n system for characterization of delicate and sensitive crystalline materials. The system\n will be mounted and integrated into an already existing Scanning Electron Microscope.\n Crystal orientation mapping and strain analysis of beam sensitive thin films of functional\n materials at the nanometer scale is essential for understanding the underlying processes\n responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end\n Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of\n delicate and sensitive crystalline materials. The system will be mounted and integrated\n into an already existing Scanning Electron Microscope. Crystal orientation mapping\n and strain analysis of beam sensitive thin films of functional materials at the nanometer\n scale is essential for understanding the underlying processes responsible for the\n (tailored) functionality.
\n
Identifikator for proceduren: 2624c551-1cb2-4764-b35d-d65ae9f3bcdb
\n
Intern identifikator: 9365
\n
Udbudsprocedure: Udbud med forhandling uden forudgående offentliggørelse
\n
2.1.1 Formål
Kontraktens art: Varer
\n
Primær klassificering (cpv): 38519300 Mikroskopkameraer
\n
\n
2.1.2 Udførelsessted
Postadresse: Anker Engelundsvej 1  
\n
By: Kongens Lyngby
\n
Postnummer: 2800
\n
Landespecifik underafdeling (NUTS): Nordsjælland (DK013)
\n
Land: Danmark
\n
\n
2.1.4 Generelle oplysninger
Yderligere oplysninger: The high-end TKD acquisition system to be procured must fulfil the requirements for\n high-end materials science research and the following criteria: - Pixelated electron\n detector for efficient TKD pattern acquisition. Suitable and optimized for high angular\n resolution (HR) TKD pattern acquisition. At least 1MPx is required to obtain the necessary\n precision in strain analysis of tailored materials. - Efficient data collection (TKD\n patterns) with low electron beam-current suitable for electron beam sensitive materials.\n - Optimized detector geometry for forward scattered electron diffraction acquisition\n for high spatial resolution orientation mapping of thin films. - Detector geometry\n for acquiring combined spot pattern and Kikuchi pattern (low and high scattering angle)\n with high pixel resolution. - Integrated elemental analysis (EDX) - Compatible with\n Thermo Fischer / FEI SEM instruments (Novo NanoSEM 600, Helios NanoLab 600) - Automated\n large area mapping for combined EBSD/TKD and EDX mapping - Integrated software solution\n for diffraction data analysis. Delivery and installation within Q4 of 2024 would be\n preferable for DTU Nanolab due to fundings.
\n
Retsgrundlag:
\n
Direktiv 2014/24/EU
\n
\n
\n
\n
5 Delkontrakt
5.1 Teknisk ID for partiet: LOT-0000
Titel: Near Axis TKD detector
\n
Beskrivelse: DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition\n system for characterization of delicate and sensitive crystalline materials. The system\n will be mounted and integrated into an already existing Scanning Electron Microscope.\n Crystal orientation mapping and strain analysis of beam sensitive thin films of functional\n materials at the nanometer scale is essential for understanding the underlying processes\n responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end\n Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of\n delicate and sensitive crystalline materials. The system will be mounted and integrated\n into an already existing Scanning Electron Microscope. Crystal orientation mapping\n and strain analysis of beam sensitive thin films of functional materials at the nanometer\n scale is essential for understanding the underlying processes responsible for the\n (tailored) functionality.
\n
Intern identifikator: 9365
\n
5.1.1 Formål
Kontraktens art: Varer
\n
Primær klassificering (cpv): 38519300 Mikroskopkameraer
\n
\n
5.1.2 Udførelsessted
Postadresse: Anker Engelundsvej 1  
\n
By: Kongens Lyngby
\n
Postnummer: 2800
\n
Landespecifik underafdeling (NUTS): Nordsjælland (DK013)
\n
Land: Danmark
\n
Yderligere oplysninger: 
\n
\n
5.1.3 Anslået varighed
Anden varighed: Ubegrænset
\n
\n
5.1.6 Generelle oplysninger
Indkøbsprojekt, der ikke finansieres med EU-midler
\n
Udbuddet er omfattet af aftalen om offentlige udbud (GPA): ja
\n
Yderligere oplysninger: The high-end TKD acquisition system to be procured must fulfil the requirements for\n high-end materials science research and the following criteria: - Pixelated electron\n detector for efficient TKD pattern acquisition. Suitable and optimized for high angular\n resolution (HR) TKD pattern acquisition. At least 1MPx is required to obtain the necessary\n precision in strain analysis of tailored materials. - Efficient data collection (TKD\n patterns) with low electron beam-current suitable for electron beam sensitive materials.\n - Optimized detector geometry for forward scattered electron diffraction acquisition\n for high spatial resolution orientation mapping of thin films. - Detector geometry\n for acquiring combined spot pattern and Kikuchi pattern (low and high scattering angle)\n with high pixel resolution. - Integrated elemental analysis (EDX) - Compatible with\n Thermo Fischer / FEI SEM instruments (Novo NanoSEM 600, Helios NanoLab 600) - Automated\n large area mapping for combined EBSD/TKD and EDX mapping - Integrated software solution\n for diffraction data analysis. Delivery and installation within Q4 of 2024 would be\n preferable for DTU Nanolab due to fundings.
\n
\n
5.1.12 Udbudsvilkår
Oplysninger om undersøgelsesfrister: Complaint that the Contracting Authority, contrary to the Public Procurement Act,\n has concluded a contract without prior publication of a contract notice in the European\n Union Official Journal must be submitted no later than 30 calendar days from the date\n after a contract award notice has been published by the Contracting Authority in the\n European Union Official Journal and that contract award notice includes the grounds\n for the decision to award the contract directly, cf. lov om Klagenævnet for Udbud\n (Complaints Board for Tenders) § 7, section 3.
\n
\n
5.1.15 Teknikker
Rammeaftale:
Ingen rammeaftale
\n
\n
Oplysninger om det dynamiske indkøbssystem:
Intet dynamisk indkøbssystem
\n
\n
\n
5.1.16 Yderligere oplysninger, mægling og gennemgang
Organisation med ansvar for klager: Klagenævnet for Udbud
\n
Organisation, der leverer oplysninger om den generelle lovgivningsramme på det sted, hvor kontrakten skal udføres, hvad angår skatter: Konkurrence- og Forbrugerstyrelsen
\n
Organisation, hvis budget anvendes til at betale for kontrakten: Danmarks Tekniske Universitet - DTU
\n
Organisation, der udfører betalingen: Danmarks Tekniske Universitet - DTU
\n
Organisation, der undertegner kontrakten: Danmarks Tekniske Universitet - DTU
\n
TED eSender: Mercell Holding ASA
\n
\n
\n
\n
6 Resultater
Værdien af alle kontrakter tildelt i denne meddelelse: 271.532 Euro
\n
Direkte tildeling:
Begrundelse for direkte tildeling: Kontrakten kan kun tildeles af en bestemt økonomisk aktør på grund af manglende konkurrence af tekniske årsager
\n
Anden begrundelse: Purchasing the Near Axis TKD (NA-TKD) detector system from Oxford Instruments GmbH\n will fulfil the requirements from DTU Nanolab and its user base for materials characterization\n as described above. The highly sensitive camera with optimized geometry for low current\n TKD pattern more than fulfils the scientific requirements for probing high-precision\n grain orientation and strain measurements of sensitive thin-film materials at the\n nanometer scale. The combination of a 1MPx+ (1244x1024px), high dynamic range (12-bit)\n camera and near-axis geometry of the acquisition provided by Oxford Instruments is\n unique on the market. This unique combination is required for high angle resolution,\n forward scattered diffraction acquisition needed for reliable, high precision strain\n measurements, which will impact DTU’s materials research tremendously. The unique\n Oxford Instrument solution (Near-Axis TKD) offers an order of magnitude improvement\n in sensitivity compared to conventional off-axis TKD acquisition allowing for robust\n data acquisition of beam sensitive materials at low beam current. Furthermore, the\n NA-TKD geometry allows for simultaneous acquisition of (low-distortion) Kikuchi and\n spot patterns required for depth information (surface vs. bulk) in thin-films. The\n Oxford NA-TKD system provides a unique solution for avoiding primary beam exposure\n to the high-sensitive Symmetry camera while acquiring spot patterns and thereby allow\n for higher sensitivity of spot patterns and Kikuchi patterns compared to competitor\n systems, where the detector is exposed to the high-intense primary beam as well. The\n Oxford system provides integrated automated large area data acquisition of combined\n diffraction data (spot and Kikuchi) and analytical data (EDX) extending the field-of-view,\n by automated stage-driven mapping. The integrated software for analysis (AZtec) provides\n high-speed, high-precision orientation mapping via pattern matching. DTU Nanolab’s\n focus on imaging and microanalysis of material science samples will push the field\n of nanoscale imaging within energy materials, quantum materials, and composite materials\n to name a few. The unique technical performance, robustness and reliability from the\n Oxford spectrometers and cameras as well as integration into already existing hardware\n at DTU Nanolab are necessary for successful development of the research fields by\n a varied user base. After extensive market research of commercially available systems\n and suppliers, DTU Nanolab has concluded that the AZtecHKL Expert system with Symmetry\n S3 camera is the only instrument meeting the high technical requirements and flexibility\n needed for DTU Nanolab to perform the variety of state-of-the-art experimental research\n proposed by DTU Nanolab and its user base. To serve DTU Nanolab’s user base and research\n portfolio, a detector system capable of acquiring simultaneous Transmission Kikuchi\n patterns (TKD), sport patterns, and analytical data in form of EDX is required. Furthermore,\n high-angle-resolution diffraction acquisition is necessary in order to meet the requirements\n of high-precision strain analysis of new tailored materials systems. In addition,\n automated large-area mapping is required to fully characterize the materials systems,\n DTU Nanolab and its user base are researching. The AZtecHKL Expert system with Symmetry\n S3 camera from Oxford Instruments is the only integrated system that provide those\n requirements. No other commercially available solutions meet the requirements.
\n
\n
6.1 Resultat delkontrakt-ID: LOT-0000
6.1.2 Oplysninger om vinderne
Vinder:
Officielt navn: Oxford Instruments GmbH
\n
Tilbud:
\n
Tilbud – Identifikator: 9365
\n
Identifikator for delkontrakt eller gruppe af delkontrakter: LOT-0000
\n
Underentrepriseværdien er kendt: nej
\n
Underentrepriseprocentdelen er kendt: nej
\n
Kontraktoplysninger:
Identifikator for kontrakten: 9365
\n
Datoen for udvælgelsen af det vindende tilbud: 30-09-2024
\n
Kontrakten tildeles som led i en rammeaftale: nej
\n
Organisation, der undertegner kontrakten: Danmarks Tekniske Universitet - DTU
\n
\n
\n
\n
\n
\n
8 Organisationer
8.1 ORG-0001
Officielt navn: Danmarks Tekniske Universitet - DTU
\n
Registreringsnummer: 30060946
\n
Postadresse: Anker Engelunds Vej 1  
\n
By: Kgs. Lyngby
\n
Postnummer: 2800
\n
Landespecifik underafdeling (NUTS): Nordsjælland (DK013)
\n
Land: Danmark
\n
Kontaktpunkt: Per Christiansen
\n
E-mail: perach@dtu.dk
\n
Telefon: +45 45252525
\n
Internetadresse: https://www.dtu.dk/
\n
Køberprofil: https://eu.eu-supply.com/ctm/company/companyinformation/index/165863
\n
Denne organisations roller:
Køber
\n
Organisation, der undertegner kontrakten
\n
Organisation, hvis budget anvendes til at betale for kontrakten
\n
Organisation, der udfører betalingen
\n
\n
\n
8.1 ORG-0002
Officielt navn: Klagenævnet for Udbud
\n
Postadresse: Nævnenes hus, Toldboden 2  
\n
By: Viborg
\n
Postnummer: 8800
\n
Landespecifik underafdeling (NUTS): Østjylland (DK042)
\n
Land: Danmark
\n
E-mail: klfu@erst.dk
\n
Telefon: +45 35291000
\n
Internetadresse: http://www.klfu.dk
\n
Denne organisations roller:
Organisation med ansvar for klager
\n
\n
\n
8.1 ORG-0003
Officielt navn: Konkurrence- og Forbrugerstyrelsen
\n
Postadresse: Carl Jacobsens Vej 35  
\n
By: Valby
\n
Postnummer: 2500
\n
Landespecifik underafdeling (NUTS): Københavns omegn (DK012)
\n
Land: Danmark
\n
E-mail: kfst@kfst.dk
\n
Telefon: +45 41715000
\n
Internetadresse: http://www.kfst.dk
\n
Denne organisations roller:
Organisation, der leverer oplysninger om den generelle lovgivningsramme på det sted, hvor kontrakten skal udføres, hvad angår skatter
\n
\n
\n
8.1 ORG-0004
Officielt navn: Oxford Instruments GmbH
\n
By: Wiesbaden
\n
Postnummer: 65205
\n
Landespecifik underafdeling (NUTS): Weißenburg-Gunzenhausen (DE25C)
\n
Land: Tyskland
\n
Kontaktpunkt: Håkan Vikstrøm
\n
E-mail: hakan.vikstrom@oxinst.com
\n
Telefon: +46854481550
\n
Denne organisations roller:
Tilbudsgiver
\n
Vinder af disse delkontrakter: LOT-0000
\n
\n
\n
8.1 ORG-0005
Officielt navn: Mercell Holding ASA
\n
Registreringsnummer: 980921565
\n
Postadresse: Askekroken 11  
\n
By: Oslo
\n
Postnummer: 0277
\n
Landespecifik underafdeling (NUTS): Oslo (NO081)
\n
Land: Norge
\n
Kontaktpunkt: eSender
\n
E-mail: publication@mercell.com
\n
Telefon: +47 21018800
\n
Fax: +47 21018801
\n
Internetadresse: http://mercell.com/
\n
Denne organisations roller:
TED eSender
\n
\n
\n
\n
11 Oplysninger om bekendtgørelsen
11.1 Oplysninger om bekendtgørelsen
Identifikator for bekendtgørelsen: f58ccd3d-ce78-49d4-b81f-cddd314fba1a - 01
\n
Formulartype: Forudgående underretning om direkte tildeling
\n
Bekendtgørelsestype: Bekendtgørelse med henblik på frivillig forudgående gennemsigtighed
\n
Afsendelsesdato for bekendtgørelsen: 02-10-2024 09:28 +00:00
\n
Dato for afsendelse af bekendtgørelse (eSender): 02-10-2024 10:00 +00:00
\n
Sprog, som denne bekendtgørelse er officielt tilgængelig på: engelsk 
\n
\n
11.2 Oplysninger om offentliggørelsen
Bekendtgørelsesnummer: 00594456-2024
\n
EUT-S-nummer: 193/2024
\n
Offentliggørelsesdato: 03-10-2024
\n
\n
\n \n","htmlEN":"\n\n \n
1 Buyer
1.1 Buyer
Official name: Danmarks Tekniske Universitet - DTU
\n
Legal type of the buyer: Body governed by public law
\n
Activity of the contracting authority: Education
\n
\n
\n
2 Procedure
2.1 Procedure
Title: Near Axis TKD detector
\n
Description: DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition\n system for characterization of delicate and sensitive crystalline materials. The system\n will be mounted and integrated into an already existing Scanning Electron Microscope.\n Crystal orientation mapping and strain analysis of beam sensitive thin films of functional\n materials at the nanometer scale is essential for understanding the underlying processes\n responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end\n Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of\n delicate and sensitive crystalline materials. The system will be mounted and integrated\n into an already existing Scanning Electron Microscope. Crystal orientation mapping\n and strain analysis of beam sensitive thin films of functional materials at the nanometer\n scale is essential for understanding the underlying processes responsible for the\n (tailored) functionality.
\n
Procedure identifier: 2624c551-1cb2-4764-b35d-d65ae9f3bcdb
\n
Internal identifier: 9365
\n
Type of procedure: Negotiated without prior call for competition
\n
2.1.1 Purpose
Main nature of the contract: Supplies
\n
Main classification (cpv): 38519300 Photo or video attachments for microscopes
\n
\n
2.1.2 Place of performance
Postal address: Anker Engelundsvej 1  
\n
Town: Kongens Lyngby
\n
Postcode: 2800
\n
Country subdivision (NUTS): Nordsjælland (DK013)
\n
Country: Denmark
\n
\n
2.1.4 General information
Additional information: The high-end TKD acquisition system to be procured must fulfil the requirements for\n high-end materials science research and the following criteria: - Pixelated electron\n detector for efficient TKD pattern acquisition. Suitable and optimized for high angular\n resolution (HR) TKD pattern acquisition. At least 1MPx is required to obtain the necessary\n precision in strain analysis of tailored materials. - Efficient data collection (TKD\n patterns) with low electron beam-current suitable for electron beam sensitive materials.\n - Optimized detector geometry for forward scattered electron diffraction acquisition\n for high spatial resolution orientation mapping of thin films. - Detector geometry\n for acquiring combined spot pattern and Kikuchi pattern (low and high scattering angle)\n with high pixel resolution. - Integrated elemental analysis (EDX) - Compatible with\n Thermo Fischer / FEI SEM instruments (Novo NanoSEM 600, Helios NanoLab 600) - Automated\n large area mapping for combined EBSD/TKD and EDX mapping - Integrated software solution\n for diffraction data analysis. Delivery and installation within Q4 of 2024 would be\n preferable for DTU Nanolab due to fundings.
\n
Legal basis:
\n
Directive 2014/24/EU
\n
\n
\n
\n
5 Lot
5.1 Lot technical ID: LOT-0000
Title: Near Axis TKD detector
\n
Description: DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition\n system for characterization of delicate and sensitive crystalline materials. The system\n will be mounted and integrated into an already existing Scanning Electron Microscope.\n Crystal orientation mapping and strain analysis of beam sensitive thin films of functional\n materials at the nanometer scale is essential for understanding the underlying processes\n responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end\n Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of\n delicate and sensitive crystalline materials. The system will be mounted and integrated\n into an already existing Scanning Electron Microscope. Crystal orientation mapping\n and strain analysis of beam sensitive thin films of functional materials at the nanometer\n scale is essential for understanding the underlying processes responsible for the\n (tailored) functionality.
\n
Internal identifier: 9365
\n
5.1.1 Purpose
Main nature of the contract: Supplies
\n
Main classification (cpv): 38519300 Photo or video attachments for microscopes
\n
\n
5.1.2 Place of performance
Postal address: Anker Engelundsvej 1  
\n
Town: Kongens Lyngby
\n
Postcode: 2800
\n
Country subdivision (NUTS): Nordsjælland (DK013)
\n
Country: Denmark
\n
Additional information: 
\n
\n
5.1.3 Estimated duration
Other duration: Unlimited
\n
\n
5.1.6 General information
Procurement Project not financed with EU Funds.
\n
The procurement is covered by the Government Procurement Agreement (GPA): yes
\n
Additional information: The high-end TKD acquisition system to be procured must fulfil the requirements for\n high-end materials science research and the following criteria: - Pixelated electron\n detector for efficient TKD pattern acquisition. Suitable and optimized for high angular\n resolution (HR) TKD pattern acquisition. At least 1MPx is required to obtain the necessary\n precision in strain analysis of tailored materials. - Efficient data collection (TKD\n patterns) with low electron beam-current suitable for electron beam sensitive materials.\n - Optimized detector geometry for forward scattered electron diffraction acquisition\n for high spatial resolution orientation mapping of thin films. - Detector geometry\n for acquiring combined spot pattern and Kikuchi pattern (low and high scattering angle)\n with high pixel resolution. - Integrated elemental analysis (EDX) - Compatible with\n Thermo Fischer / FEI SEM instruments (Novo NanoSEM 600, Helios NanoLab 600) - Automated\n large area mapping for combined EBSD/TKD and EDX mapping - Integrated software solution\n for diffraction data analysis. Delivery and installation within Q4 of 2024 would be\n preferable for DTU Nanolab due to fundings.
\n
\n
5.1.12 Terms of procurement
Information about review deadlines: Complaint that the Contracting Authority, contrary to the Public Procurement Act,\n has concluded a contract without prior publication of a contract notice in the European\n Union Official Journal must be submitted no later than 30 calendar days from the date\n after a contract award notice has been published by the Contracting Authority in the\n European Union Official Journal and that contract award notice includes the grounds\n for the decision to award the contract directly, cf. lov om Klagenævnet for Udbud\n (Complaints Board for Tenders) § 7, section 3.
\n
\n
5.1.15 Techniques
Framework agreement:
No framework agreement
\n
\n
Information about the dynamic purchasing system:
No dynamic purchase system
\n
\n
\n
5.1.16 Further information, mediation and review
Review organisation: Klagenævnet for Udbud
\n
Organisation providing information concerning the general regulatory framework for taxes applicable in the place where the contract is to be performed: Konkurrence- og Forbrugerstyrelsen
\n
Organisation whose budget is used to pay for the contract: Danmarks Tekniske Universitet - DTU
\n
Organisation executing the payment: Danmarks Tekniske Universitet - DTU
\n
Organisation signing the contract: Danmarks Tekniske Universitet - DTU
\n
TED eSender: Mercell Holding ASA
\n
\n
\n
\n
6 Results
Value of all contracts awarded in this notice: 271.532 Euro
\n
Direct award:
Justification for direct award: The contract can be provided only by a particular economic operator because of an absence of competition for technical reasons
\n
Other justification: Purchasing the Near Axis TKD (NA-TKD) detector system from Oxford Instruments GmbH\n will fulfil the requirements from DTU Nanolab and its user base for materials characterization\n as described above. The highly sensitive camera with optimized geometry for low current\n TKD pattern more than fulfils the scientific requirements for probing high-precision\n grain orientation and strain measurements of sensitive thin-film materials at the\n nanometer scale. The combination of a 1MPx+ (1244x1024px), high dynamic range (12-bit)\n camera and near-axis geometry of the acquisition provided by Oxford Instruments is\n unique on the market. This unique combination is required for high angle resolution,\n forward scattered diffraction acquisition needed for reliable, high precision strain\n measurements, which will impact DTU’s materials research tremendously. The unique\n Oxford Instrument solution (Near-Axis TKD) offers an order of magnitude improvement\n in sensitivity compared to conventional off-axis TKD acquisition allowing for robust\n data acquisition of beam sensitive materials at low beam current. Furthermore, the\n NA-TKD geometry allows for simultaneous acquisition of (low-distortion) Kikuchi and\n spot patterns required for depth information (surface vs. bulk) in thin-films. The\n Oxford NA-TKD system provides a unique solution for avoiding primary beam exposure\n to the high-sensitive Symmetry camera while acquiring spot patterns and thereby allow\n for higher sensitivity of spot patterns and Kikuchi patterns compared to competitor\n systems, where the detector is exposed to the high-intense primary beam as well. The\n Oxford system provides integrated automated large area data acquisition of combined\n diffraction data (spot and Kikuchi) and analytical data (EDX) extending the field-of-view,\n by automated stage-driven mapping. The integrated software for analysis (AZtec) provides\n high-speed, high-precision orientation mapping via pattern matching. DTU Nanolab’s\n focus on imaging and microanalysis of material science samples will push the field\n of nanoscale imaging within energy materials, quantum materials, and composite materials\n to name a few. The unique technical performance, robustness and reliability from the\n Oxford spectrometers and cameras as well as integration into already existing hardware\n at DTU Nanolab are necessary for successful development of the research fields by\n a varied user base. After extensive market research of commercially available systems\n and suppliers, DTU Nanolab has concluded that the AZtecHKL Expert system with Symmetry\n S3 camera is the only instrument meeting the high technical requirements and flexibility\n needed for DTU Nanolab to perform the variety of state-of-the-art experimental research\n proposed by DTU Nanolab and its user base. To serve DTU Nanolab’s user base and research\n portfolio, a detector system capable of acquiring simultaneous Transmission Kikuchi\n patterns (TKD), sport patterns, and analytical data in form of EDX is required. Furthermore,\n high-angle-resolution diffraction acquisition is necessary in order to meet the requirements\n of high-precision strain analysis of new tailored materials systems. In addition,\n automated large-area mapping is required to fully characterize the materials systems,\n DTU Nanolab and its user base are researching. The AZtecHKL Expert system with Symmetry\n S3 camera from Oxford Instruments is the only integrated system that provide those\n requirements. No other commercially available solutions meet the requirements.
\n
\n
6.1 Result lot ldentifier: LOT-0000
6.1.2 Information about winners
Winner:
Official name: Oxford Instruments GmbH
\n
Tender:
\n
Tender identifier: 9365
\n
Identifier of lot or group of lots: LOT-0000
\n
Subcontracting value is known: no
\n
Subcontracting percentage is known: no
\n
Contract information:
Identifier of the contract: 9365
\n
Date on which the winner was chosen: 30-09-2024
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The contract is awarded within a framework agreement: no
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Organisation signing the contract: Danmarks Tekniske Universitet - DTU
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8 Organisations
8.1 ORG-0001
Official name: Danmarks Tekniske Universitet - DTU
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Registration number: 30060946
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Postal address: Anker Engelunds Vej 1  
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Town: Kgs. Lyngby
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Postcode: 2800
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Country subdivision (NUTS): Nordsjælland (DK013)
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Country: Denmark
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Contact point: Per Christiansen
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Email: perach@dtu.dk
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Telephone: +45 45252525
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Internet address: https://www.dtu.dk/
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Buyer profile: https://eu.eu-supply.com/ctm/company/companyinformation/index/165863
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Roles of this organisation:
Buyer
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Organisation signing the contract
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Organisation whose budget is used to pay for the contract
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Organisation executing the payment
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8.1 ORG-0002
Official name: Klagenævnet for Udbud
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Postal address: Nævnenes hus, Toldboden 2  
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Town: Viborg
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Postcode: 8800
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Country subdivision (NUTS): Østjylland (DK042)
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Country: Denmark
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Email: klfu@erst.dk
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Telephone: +45 35291000
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Internet address: http://www.klfu.dk
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Roles of this organisation:
Review organisation
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8.1 ORG-0003
Official name: Konkurrence- og Forbrugerstyrelsen
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Postal address: Carl Jacobsens Vej 35  
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Town: Valby
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Postcode: 2500
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Country subdivision (NUTS): Københavns omegn (DK012)
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Country: Denmark
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Email: kfst@kfst.dk
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Telephone: +45 41715000
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Internet address: http://www.kfst.dk
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Roles of this organisation:
Organisation providing information concerning the general regulatory framework for taxes applicable in the place where the contract is to be performed
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8.1 ORG-0004
Official name: Oxford Instruments GmbH
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Town: Wiesbaden
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Postcode: 65205
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Country subdivision (NUTS): Weißenburg-Gunzenhausen (DE25C)
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Country: Germany
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Contact point: Håkan Vikstrøm
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Email: hakan.vikstrom@oxinst.com
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Telephone: +46854481550
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Roles of this organisation:
Tenderer
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Winner of these lots: LOT-0000
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8.1 ORG-0005
Official name: Mercell Holding ASA
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Registration number: 980921565
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Postal address: Askekroken 11  
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Town: Oslo
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Postcode: 0277
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Country subdivision (NUTS): Oslo (NO081)
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Country: Norway
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Contact point: eSender
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Email: publication@mercell.com
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Telephone: +47 21018800
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Fax: +47 21018801
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Internet address: http://mercell.com/
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Roles of this organisation:
TED eSender
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11 Notice information
11.1 Notice information
Notice identifier/version: f58ccd3d-ce78-49d4-b81f-cddd314fba1a - 01
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Form type: Direct award preannouncement
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Notice type: Voluntary ex-ante transparency notice
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Notice dispatch date: 02-10-2024 09:28 +00:00
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Notice dispatch date (eSender): 02-10-2024 10:00 +00:00
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Languages in which this notice is officially available: English 
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11.2 Publication information
Notice publication number: 00594456-2024
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OJ S issue number: 193/2024
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Publication date: 03-10-2024
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